This book describes both theory and practice of optical techniques to measure various parameters encountered routinely in science and engineering.
Introduction to Optical Metrology, Second Edition examines the theory and practice of various measurement methodologies utilizing both the corpuscular and the wave nature of light. The book begins by introducing the subject of optics and then addresses the propagation of laser beams through free space and optical systems. It discusses interferometry, holography, speckle metrology, moiré phenomenon, photoelasticity, and microscopy. Remaining chapters describe techniques and methods of measurements of refractive index, thickness, radii of curvature, angle, velocity, pressure, length, optical testing, and fiber-optic based methods. Apart from these, this edition includes a chapter on temperature measurement, sections on fringe unwrapping methods, testing of freeform optics, shearography etc. Featuring new and updated exercise problems at the end of each chapter, this edition provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
The primary audience for this book is undergraduate and graduate students who specialize in optics. It will also be useful to researchers and professionals working on optical testing and fiber optic- and MEMS-based measurements. A solutions manual and figure slides are available for adopting professors.
Chapter 1 Introduction to Optics Chapter 2 Laser Beams Chapter 3 Sources, Detectors and Recording media Chapter 4 Interferometry Chapter 5 Holography and Digital Holography Chapter 6 Speckle Phenomenon, Speckle Photography and Speckle Interferometry Chapter 7 The Moiré Phenomenon Chapter 8 Photoelasticity Chapter 9 Microscopy Chapter 10 Measurement of Refractive Index Chapter 11 Measurement of radius of curvature and focal length Chapter 12 Optical Testing Chapter 13 Angle Measurement Chapter 14 Thickness measurement Chapter 15 Measurement of Velocity Chapter 16 Pressure Measurement Chapter 17 Temperature Measurement Chapter 18 Fiber Optic and MEMs based Measurements Chapter 19 Length Measurement
Biography
Professor Rajpal Singh Sirohi served as Professor of Physics at IIT Madras for more than two decades, as well as Director of IIT Delhi and Vice Chancellor to several Universities in India. He was a Distinguished Scholar to Rose-Hulman Institute of Technology, Terre Haute, USA, Chair Professor Tezpur University, Assam India, Faculty at Alabama A&M University, Huntsville, Alabama USA. Prof. Rajpal Singh Sirohi is now retired, and spends his time reading books on history of science and spends mornings and evenings with his grandchildren. Prof. Sirohi’s research areas are Optical Metrology, Optical Instrumentation, Laser Instrumentation, Holography and Speckle Phenomenon.
